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z.test_01
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2022
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BASE
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3 |
Test subcollection
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2022
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BASE
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4 |
test
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2022
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BASE
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5 |
Saliva Pepsin Concentration of Laryngopharyngeal Reflux Patients Is Influenced by Meals Consumed Before the Samples
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In: ISSN: 0023-852X ; Laryngoscope ; https://hal.archives-ouvertes.fr/hal-03141469 ; Laryngoscope, Wiley, 2021, 131 (2), pp.350-359. ⟨10.1002/lary.28756⟩ (2021)
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BASE
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6 |
Hypopharyngeal-Esophageal Impedance-pH Monitoring Profiles of Laryngopharyngeal Reflux Patients
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In: ISSN: 0023-852X ; Laryngoscope ; https://hal.archives-ouvertes.fr/hal-03141466 ; Laryngoscope, Wiley, 2021, 131 (2), pp.268-276. ⟨10.1002/lary.28736⟩ (2021)
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BASE
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7 |
Test bundle
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2021
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BASE
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9 |
ludo
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2021
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BASE
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10 |
Archiving test collection
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2021
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BASE
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11 |
Subcollection
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2021
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BASE
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12 |
bundle02
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2020
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BASE
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13 |
bundle01
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test. - : The Language Archive, Max Planck Institute for Psycholinguistics, 2019
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BASE
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15 |
Programmable volatile/non-volatile memory cell
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In: https://hal-lirmm.ccsd.cnrs.fr/lirmm-01688122 ; United States, Patent n° : US20140050012 A1. 2014 (2014)
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BASE
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16 |
Compact volatile/non-volatile memory cell
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In: https://hal-lirmm.ccsd.cnrs.fr/lirmm-01688147 ; United States, Patent n° : US20140043062 A1. 2014 (2014)
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BASE
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19 |
TOETS: Work Package 1
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In: The European Nanoelectronics Forum 2011 ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00653039 ; The European Nanoelectronics Forum 2011, Nov 2011, Dublin, Ireland. 2011 ; http://www.catrene.org/web/forum2011/ (2011)
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BASE
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20 |
Wireless Wafer Test for Iterative Testing During System Assembly
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In: 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537849 ; 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, Texas, United States. 1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010 ; http://www.ieee-tttc.org/ebshistory/2010/2010-06-14%203D-Test10%20CfP.html (2010)
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